Experimental Setups for Single Event Effect Studies

N. H.  Medina; V. A. P.  Aguiar; N.  Added; F.  Aguirre; E. L. A.  Macchione; S. G.  Alberton; M. A. G.  Silveira; J.  Benfica; F.   Vargas; B.  Porcher

doi:10.15415/jnp.2016.41002

Authors

N. H. Medina Instituto de Física, Universidade de São Paulo, Brazil.
V. A. P. Aguiar Instituto de Física, Universidade de São Paulo, Brazil.
N. Added Instituto de Física, Universidade de São Paulo, Brazil.
F. Aguirre Instituto de Física, Universidade de São Paulo, Brazil.
E. L. A. Macchione Instituto de Física, Universidade de São Paulo, Brazil.
S. G. Alberton Instituto de Física, Universidade de São Paulo, Brazil.
M. A. G. Silveira Centro Universitário da FEI, São Bernardo do Campo, Brazil.
J. Benfica Pontifícia Universidade Católica do Rio Grande do Sul, Porto Alegre, Brazil
F. Vargas Pontifícia Universidade Católica do Rio Grande do Sul, Porto Alegre, Brazil
B. Porcher Pontifícia Universidade Católica do Rio Grande do Sul, Porto Alegre, Brazil

DOI:

https://doi.org/10.15415/jnp.2016.41002

Keywords:

Radiation effects, electronic devices, single event effects

Abstract

Experimental setups are being prepared to test and to qualify electronic devices regarding their tolerance to Single Event Effect (SEE). A multiple test setup and a new beam line developed especially for SEE studies at the São Paulo 8 UD Pelletron accelerator were prepared. This accelerator produces proton beams and heavy ion beams up to ¹⁰⁷Ag. A Super conducting Linear accelerator, which is under construction, may fulfill all of the European Space Agency requirements to qualify electronic components for SEE.

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References

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