Experimental Setups for Single Event Effect Studies

  • N.H. Medina Instituto de Física, Universidade de São Paulo, Brazil.
  • V.A.P. Aguiar Instituto de Física, Universidade de São Paulo, Brazil.
  • N. Added Instituto de Física, Universidade de São Paulo, Brazil.
  • F. Aguirre Instituto de Física, Universidade de São Paulo, Brazil.
  • E.L.A. Macchione Instituto de Física, Universidade de São Paulo, Brazil.
  • S.G. Alberton Instituto de Física, Universidade de São Paulo, Brazil.
  • M.A.G. Silveira Centro Universitário da FEI, São Bernardo do Campo, Brazil.
  • J. Benfica Pontifícia Universidade Católica do Rio Grande do Sul, Porto Alegre, Brazil
  • F. Vargas Pontifícia Universidade Católica do Rio Grande do Sul, Porto Alegre, Brazil
  • B. Porcher Pontifícia Universidade Católica do Rio Grande do Sul, Porto Alegre, Brazil
Keywords: Radiation effects, electronic devices, single event effects

Abstract

Experimental setups are being prepared to test and to qualify electronic devices regarding their tolerance to Single Event Effect (SEE). A multiple test setup and a new beam line developed especially for SEE studies at the São Paulo 8 UD Pelletron accelerator were prepared. This accelerator produces proton beams and heavy ion beams up to 107Ag. A Super conducting Linear accelerator, which is under construction, may fulfill all of the European Space Agency requirements to qualify electronic components for SEE.

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References

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Published
2016-08-08
How to Cite
N.H. Medina, V.A.P. Aguiar, N. Added, F. Aguirre, E.L.A. Macchione, S.G. Alberton, M.A.G. Silveira, J. Benfica, F. Vargas, & B. Porcher. (2016). Experimental Setups for Single Event Effect Studies . Journal of Nuclear Physics, Material Sciences, Radiation and Applications, 4(1), 13-23. https://doi.org/10.15415/jnp.2016.41002
Section
Articles