Nuclear Tracks Morphology Study Using Raman Methodology
In this work, a new methodology for rendering profiles of etched nuclear tracks is presented, using confocal micro-Raman spectrometry instrumentation. The precise profile of etched nuclear tracks with normal and/or angular incidence of the particle can be determined in few minutes, with a great visual and numerical resolution, that means a quantitative and qualitative simultaneous chemical and morphology characterization with the Raman technique. The Raman image routine is designed to acquire at each image pixel a complete Raman spectrum. This is a mapping of the functional groups that form the polymeric structure, which may be broken by the damage caused by the incident radiation and/or the etching process.
Chong, C., Ishak, I., Mahat, R. & Amin, Y. UV-VIS and FTIR spectral studies of CR-39 plastics irradiated with X-rays. Radiation Measurements, 28(1-6), 119-122 (1997). http://dx.doi.org/10.1016/S1350-4487(97)00051-6
Espinosa, G., Gammage, R., Golzarri, J. & Casta-o, V. Studies on the interaction of alpha particles with polycarbonate materials.Int. J. Polym. Mater., Issue 40, 87-95 (1998).
Espinosa, G., Jacobson, I., Golzarri, J.I., Vázquez, C., Fragoso, R. & Santos, E. Analysis of the formed track in solid state materials using atomic force microscopy. Radiation Protection Dosimetry, 101(1-4), 89-92 (2002). http://dx.doi.org/10.1093/oxfordjournals.rpd.a006066
Fawzy Eissa, M., et al. Optical Properties of CR-39 Track Etch Detectors Irradiated by Alpha Particles with Different Energies. Journal of Materials Science and Engineering, 5, 26-31 (2011).
Félix-Bautista, R., Hernández-Hernández, C., Zendejas-Leal, B.E., Fragoso, R., Golzarri, J.I., Vázquez-López, C. & Espinosa, G. Evolution of etched nuclear track profiles of alpha particles in CR-39 by atomic force microscopy.Radiation Measurements, 50, 197-200 (2013). http://dx.doi.org/10.1016/j.radmeas.2013.01.002
Mosier-Boss, P. et al. Comparison of SEM and optical analyses of DT neutron tracks in CR-39 detectors. Radiation Measurements, Issue 47, 57-66 (2012). http://dx.doi.org/10.1016/j.radmeas.2011.10.004
Nikezic, D. et al. Feasibility and limitation of track studies using atomic force microscopy. Nuclear Instruments and Methods in Physics Research, 197-B, 293-300 (2002). http://dx.doi.org/10.1016/S0168-583X(02)01480-5
Palacios, F. et al. 3D image reconstruction of transparent microscopic objects using digital holography. Optics Communications, Issue 248, 41-50 (2005). http://dx.doi.org/10.1016/j.optcom.2004.11.095
Stuani Pereira, L. A. et al. Micro-Raman Spectroscopic Characterization of a CR39 Detector. Applied Spectroscopy,67(4), 404-408 (2013). http://dx.doi.org/10.1366/12-06741
Vaginay, F. et al. 3-D confocal microscopy track analysis: a promising tool for determining CR-39 response function. Radiation Measurements, Volume 34, 123 (2001). http://dx.doi.org/10.1016/S1350-4487(01)00136-6
Yamamoto, M. et al. Atomic force microscopic analysis of heavy ion tracks in CR-39. Nuclear Instruments and Methods in Physics Research, 152-B, 349-356 (1999). http://dx.doi.org/10.1016/S0168-583X(99)00121-4
Yamauchi, T., Takada, S., Ichijo, H. & Oda, K. Raman and near-IR study on proton irradiated CR-39 detector and the effect of air-leak on damage formation. Radiation Measurements, Issue 34, 69-73 (2001). http://dx.doi.org/10.1016/S1350-4487(01)00123-8
Yasuda, N. et al. Measurement of bulk etch rate of CR-39 with atomic force microscopy. Nuclear Instruments and Methods in Physics Research, 142-B, 111-116 (1998). http://dx.doi.org/10.1016/S0168-583X(98)00267-5
Ziegler J., Biersack, J. & Littmark U.The Stopping and Range of Ions in Solids, Pergamon Press, Oxford (1985).
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