DHOUBHADEL, M. S. .; ROUT, B. .; LAKSHANTHA, W. J. .; MCDANIEL, F. D. . Investigation of the Saturation of Elemental Concentration in the Depth Profile of Low Energy Silver Ion Implants in Silicon . Journal of Nuclear Physics, Material Sciences, Radiation and Applications, [S. l.], v. 4, n. 1, p. 251–264, 2016. DOI: 10.15415/jnp.2016.41024. Disponível em: https://jnp.chitkara.edu.in/index.php/jnp/article/view/126. Acesso em: 29 nov. 2022.