KUMAR, S. .; MEHTA, D. . Elemental Analysis of Soil Samples Using Thick Target-Particle Induced X-Ray Emission (TT-PIXE) Technique . Journal of Nuclear Physics, Material Sciences, Radiation and Applications, [S. l.], v. 1, n. 2, p. 225–237, 2014. DOI: 10.15415/jnp.2014.12018. Disponível em: https://jnp.chitkara.edu.in/index.php/jnp/article/view/176. Acesso em: 2 may. 2024.