JIMENEZ-MIER, J. .; OLALDE-VELASCO, . P.; MORA, P. D. L. .; YANG, W. .-L. .; DENLINGER, J. . Atomic Multiplet and Charge Transfer Effects in the Resonant Inelastic X-Ray Scattering (RIXS) Spectra at the Nickel L2,3 Edge of NiF2 . Journal of Nuclear Physics, Material Sciences, Radiation and Applications, [S. l.], v. 5, n. 1, p. 1–13, 2017. DOI: 10.15415/jnp.2017.51001. Disponível em: https://jnp.chitkara.edu.in/index.php/jnp/article/view/67. Acesso em: 16 apr. 2024.