Elemental Analysis of Nanomaterial Using Photon-Atom Interaction Based EDXRF Technique

  • Sanjeev Kumar G.G.D.S.D. College Sector-32, Chandigarh
  • Arun Kumar Department of Physics, Panjab University, Chandigarh
  • Mansi Chitkara Nanomaterials Research Laboratory, Chitkara University, Rajpura 140401, Punjab, India
  • I.S. Sandhu Nanomaterials Research Laboratory, Chitkara University, Rajpura 140401, Punjab, India
  • Devinder Mehta Department of Physics, Panjab University, Chandigarh
Keywords: Nanomaterial, EDXRF Technique, Photon-Atom Interaction


Presence of trace amount of foreign impurities (both metallic and non-metallic) in standard salts used for sample preparation and during the synthesis process can alter the physical and chemical behavior of the pure and doped nano-materials. Therefore, it becomes important to determine concentration of various elements present in synthesized nano-material sample. In present work, the elemental and compositional analysis of nano-materials synthesized using various methods has been performed using photon-atom interaction based energy dispersive x-ray fluorescence (EDXRF) technique. This technique due to its multielement analytical capability, lower detection limit, capability to analyze metals and non-metals alike and almost no sample preparation requirements can be utilized for analysis of nano-materials. The EDXRF spectrometer involves a 2.4 kW Mo anode x-ray tube (Pananalytic, Netherland) equipped with selective absorbers as an excitation source and an LEGe detector (FWHM = 150 eV at 5.895 keV, Canberra, US) coupled with PC based multichannel analyzer used to collect the fluorescent x-ray spectra. The analytical results showed good agreements with the expected values calculated on the basis of the precursor used in preparation of nano-materials.


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How to Cite
Sanjeev Kumar, Arun Kumar, Mansi Chitkara, I.S. Sandhu, & Devinder Mehta. (1). Elemental Analysis of Nanomaterial Using Photon-Atom Interaction Based EDXRF Technique . Journal of Nuclear Physics, Material Sciences, Radiation and Applications, 1(1), 61-70. https://doi.org/10.15415/jnp.2013.11006